X-ray diffractometer
DX-27mini Benchtop X-ray diffractometer
Designed for industrial production and quality control, advanced technology for the production of concentrated X-ray diffractometers, functionalized and miniaturized benchtop X-ray diffractometers. Qualitative analysis, quantification and crystal structure analysis of metal and non-metal samples. Especially suitable for catalyst, titanium dioxide, cement, pharmaceutical and other product manufacturing industries.
主要技術指標：
| General | |
| Counter | Closed proportional or semiconductor linear array detector（MYTHEN2 1D） |
| Maximum linear count rate | ≥5×105cps(direct ratio), ≥1×107cps(linear array detector) |
| Energy spectrum resolution | <25% |
| Radioactivity protection | Lead+lead glass protection,optical gate and protection cover are locked, outside radioactive dose <1μSv/h |
| Overall reliability | ≤1‰ |
| Size | 600×410×670（W×D×H）mm |
| Generator | |
| Power | Solid state X-ray generator：600W(40kV, 15mA) . Reliability: <0.005% |
| X-ray tube | Cermet X-ray tube, Cu target, power 2.4kW, focus：1 x 10 mm Water cooler（water flowrate>1L/min） |
| Angle measurer | |
| Structure | Sample horizontalθs-θd structure. |
| Diffraction circle radius | 150mm |
| Scan mode | Continuous, stepping, Omg（servo motor） |
| Measurement range | θs/θd linkage -3°～150° |
| Minimum step width angle | 0.0001° |
| Angle repeatability | 0.0005° |
| Linearity of diffraction angle | <0.02°（Standard sample, within the full spectrum） |
| Angle location speed | 1500°/min |
| Computer | |
| Standard configuration | Dell Business Notebook |
| Recommended Configuration | Intel i3, 4GB RAM, 128G SDD, RW |
| Operation system | Windows 7, or 10 |
| Software | |
| Control | 1. Automatic control generator tube voltage, tube current, optical gate and tube training. 2. Control angle measurement scan continuously or stepping, and collect the diffraction data at the same time. 3. Diffraction data processing: automatic peak searching, manual peak searching, integral strength, peak height, center of gravity, background removing, smooth, peak shape amplification, spectrogram comparing, etc. |
| Data processing software | Phase qualitative and quantitative analysis, Kα1,α2 peeling off, whole spectrogram fitting, selected peak fitting, half high width and crystal grain size calculation, crystal cell measurement, stress calculation, diffraction line indexing, multiple drawing, 3D drawing, diffraction data correction, background removing, no standard sample quantification function, Full spectrum fitting (WPF), XRD diffraction spectrum simulation. |
